The use of digital ICs has increased over to such an extend that by now on average four to five ICs are used in a relatively small circuit. This does not make trouble shooting any easier; for this reason a universal tester was designed which can be used for tE)sting I Cs under operating conditions. The probe discussed in this article is suitable for testing 14- and 16-pin dual-in-line ICs
Downloading of this magazine article is reserved for registered users only.
Discussion (0 comments)