The test methods described so far in this
series apply only to low-frequeney (LF)
equipment. In circuits carrying high-frequency
(HF) signals, the effects of Ihe measuring
equipment become an important factor.
First of all, of course, the test instruments
used musr be designed for HF measurements.
Also, unless suitable measures are
taken, tests may result in reflections and radiation
of HF energy, which will invalidate
the test results.
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