The unit described here enables you to test NPN and PNP bipolar transistors, N- or P-channel FETs or MOSFETs, UJTs, triacs, and thyristors. Regardless of the type of device, the tests are non-destructive. Universal connectors allow testing of all package types, including SMDs (up to a point). The unit lets you change from one type of device to another in a trice.